Advanced FIB & TEM For Wafers Analysis
Delivery term:The date of payment from buyers deliver within days- Price:
Negotiable
- minimum:
- Total supply:
- Delivery term:
The date of payment from buyers deliver within days
- seat:
- Validity to:
Long-term effective
- Last update:
2026-10-17 02:35
- Browse the number:
0
Company Profile
- GRG METROLOGY & TEST GROUP CO., LTD.
-
Contact:
erofuz(Ms.)
-
Email:
-
Telephone:
-
Phone:
- Area:
-
Address:
No.8 Chuangyun Road, Shiqi Town, Panyu District, Guangzhou City,China
- Website: http://f56d0e27.maoyitrader.com/
By certification [File Integrity]
Product details
GRGTEST Metrology possesses patented technologies including methods for eliminating the curtain effect of the FIB focused ion beam, a novel framework structure method for preparing heat-sensitive TEM ultrathin samples using DB FIB, a FIB step-thinning method for preparing ultrathin TEM samples of brittle and easily cracked materials, a focused ion beam ultrathin sectioning pretreatment method for radiation-sensitive fine-structure wafer samples, and a method for preparing TEM samples using FIB inverted cutting. These technologies enable high-resolution TEM images with no electron beam damage, achieving atomic-level resolution morphological characterization and compositional analysis of advanced process chips.
link:http://www.grgtmall.net
link:http://www.grgtmall.net
New Products
-
China Vehicle Export Company
price: Negotiable
-
Wholesale Cars from China
price: Negotiable
-
Import Cars from China
price: Negotiable
-
RTCA/DO-160 testing
price: Negotiable
-
metrology calibration for solar simulators
price: Negotiable
-
Failure Analysis of Semiconductor Chips
price: Negotiable
